Abstract
This study investigates the impact of varying thicknesses on the structural, morphological, and optical properties of ultrathin Cu2ZnSnSe4 (CZTSe) films deposited on SLG via thermal evaporation. CZTSe powders of different weights (0.002 g, 0.006 g, and 0.01 g) were evaporated and subsequently annealed at 300°C. XRD, AFM, and UV-Vis analyses were employed to characterize the resulting films. The results indicated that increased thickness enhances crystallinity, evidenced by sharper XRD peaks and larger crystallite sizes for thicker films, and thicker films exhibit smoother surfaces with smaller particle diameters and heights compared to thinner films.